Once a sample has been synthesized, its properties must be measured. One of
the most important properties is the configuration of the atoms inside the sample.
Our structural measurement labs are located adjacent to the deposition laboratory
in rooms 2015 and 2019.

 

High Resolution X-ray Diffraction (HRXRD)

The High Resolution X-Ray Diffractometer consists of a sealed Copper
tube source, a 4-axis Huber Cradle, and a Point Detector. The system was
manufactured by Bruker-AXS and is capable of measuring lattice parameters
with an error of +/- .0005 angstroms (That's within 0.00000000000005 meters!)

 

GADDS

This machine is equipped with a 2-dimensional area detector which is capable of
capturing many diffracted beams at the same time. This gives us the ability to quickly
see what phases have formed and their degree of crystallinity.

 

Atomic Force Microscopy (AFM)

The Atomic Force Microscope (AFM) is capable of imaging
atomic sized features on the surface of a sample by dragging a
tip over the surface. The machine is so sensitive that talking
in the room or even traffic outside the building can affect the
measurement, so it has a special vibration dampening system.